The Use Of Electron Backscattered Diffraction For Material Characterization At Chalk River Laboratories

Abstract

Electron Backscattered Diffraction (EBSD) is continuing to emerge as a valuable tool for characterizing polycrystalline engineering materials. This technique permits sub-micron measurements of materials to evaluate localized texture, grain size, grain boundary interactions, and residual plastic deformation. This paper presents the working principles and current potential for characterizing nuclear materials with EBSD.